OCCAM Ontario Centre for the Characterisation of Advanced Materials

Low Energy Ion Scattering LEIS. HF3300 Environmental-CFE-TEM. NB5000 Precise Cutting and Observation Tool. SU3500 Variable Pressure SEM. The atomic level properties of a material both surface and bulk greatly influence its overall performance. Understanding these properties is of primary importance, requiring. Acquisition of the richest possible chemical information. Structural imaging down to the nanometer and sub-nanometer scale. By expanding the leading edge capabilities of. New solutions t.

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Materials Science and Engineering University of Toronto

Department of Materials Science and Engineering. Department of Materials Science and Engineering. Ursula Franklin Women in MSE Seminar Series.

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PAGE TITLE

OCCAM Ontario Centre for the Characterisation of Advanced Materials

DESCRIPTION

Low Energy Ion Scattering LEIS. HF3300 Environmental-CFE-TEM. NB5000 Precise Cutting and Observation Tool. SU3500 Variable Pressure SEM. The atomic level properties of a material both surface and bulk greatly influence its overall performance. Understanding these properties is of primary importance, requiring. Acquisition of the richest possible chemical information. Structural imaging down to the nanometer and sub-nanometer scale. By expanding the leading edge capabilities of. New solutions t.

CONTENT

This site states the following, "NB5000 Precise Cutting and Observation Tool." We noticed that the web page said " SU3500 Variable Pressure SEM." It also stated " The atomic level properties of a material both surface and bulk greatly influence its overall performance. Understanding these properties is of primary importance, requiring. Acquisition of the richest possible chemical information. Structural imaging down to the nanometer and sub-nanometer scale. By expanding the leading edge capabilities of."

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